The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2011
Filed:
Oct. 12, 2007
Deli Zhao, Beijing, CN;
Zhouchen Lin, Beijing, CN;
Xiaoou Tang, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
Systems and methods perform Laplacian Principal Components Analysis (LPCA). In one implementation, an exemplary system receives multidimensional data and reduces dimensionality of the data by locally optimizing a scatter of each local sample of the data. The optimization includes summing weighted distances between low dimensional representations of the data and a mean. The weights of the distances can be determined by a coding length of each local data sample. The system can globally align the locally optimized weighted scatters of the local samples and provide a global projection matrix. The LPCA improves performance of such applications as face recognition and manifold learning.