The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2011

Filed:

Dec. 20, 2006
Applicants:

Bridget Tannian, Hyde Park, MA (US);

Brad Hubbard-nelson, Concord, MA (US);

Alfred Oleru, Quincy, MA (US);

Inventors:

Bridget Tannian, Hyde Park, MA (US);

Brad Hubbard-Nelson, Concord, MA (US);

Alfred Oleru, Quincy, MA (US);

Assignee:

Innov-X-Systems, Inc., Woburn, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract

A hand-held XRF analyzer including an x-ray source for emitting x-rays through a window to a sample. A detector behind the window is responsive to x-rays irradiated by the sample. A controlled volume about the x-ray source and the detector is maintained in a vacuum or a predetermined purge condition for a predetermined amount of time for increasing the sensitivity of the analyzer. A processor is responsive to the detector for analyzing the spectrum of irradiated x-rays and responsive to a pressure sensor for detecting a pressure change inside the controlled volume. The processor is configured to detect if the vacuum or the predetermined purge condition has been compromised.


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