The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2011
Filed:
Mar. 08, 2007
Stephan Wienand, Zwingenberg, DE;
Armin Rudert, Essen, DE;
Stephan Wienand, Zwingenberg, DE;
Armin Rudert, Essen, DE;
ISRA Surface Vision GmbH, Herten, DE;
Abstract
The invention describes a method for measuring the shape of a reflective surface () and a corresponding system which has at least one pattern () for reflection at the reflective surface () and at least one camera () for viewing the pattern () which is reflected at the surface () pixel by pixel, wherein the position and orientation of the camera () and of the pattern () are known. In order to reliably measure the shape of reflective surfaces with a small amount of equipment complexity, the viewing directions of the camera (), which are known for the pixels (), and the positions of the pattern (), which correspond to the mapping of the reflected pattern () to pixels () of the camera (), are used to determine the surface angle and surface height for the purpose of measuring the shape.