The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2011

Filed:

Mar. 30, 2007
Applicants:

Norimasa Yamamoto, Kobe, JP;

Naohiko Matsuo, Kobe, JP;

Takashi Yamato, Kobe, JP;

Inventors:

Norimasa Yamamoto, Kobe, JP;

Naohiko Matsuo, Kobe, JP;

Takashi Yamato, Kobe, JP;

Assignee:

Sysmex Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/25 (2006.01); G01J 3/51 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample analyzer is disclosed that comprising: a light source section for emitting light; a first optical information acquiring section for illuminating a sample with the light emitted by the light source section, and for acquiring first optical information; and a second optical information acquiring section for illuminating a measurement specimen, to be prepared by adding a reagent to the sample, with the light emitted by the light source section, and for and acquiring second optical information. A sample analyzing method, intended for use in an automated sample analyzer, is also described.


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