The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2011
Filed:
Aug. 06, 2007
Franz Leberl, Boulder, CO (US);
Michael Gruber, Graz, AT;
Martin Ponticelli, Graz, AT;
Microsoft Corporation, Redmond, WA (US);
Abstract
Apparatuses and methods for enhancing a 'primary' large format, digital, macro-image with 'secondary' image data are provided. The secondary image data is collected utilizing one or more secondary optical systems having at least one electro-optical detector array (e.g., a CCD array) and a specific set of optical mirrors or optical prisms, arranged in such a way that the secondary optical systems extend the angular field-of-view of the primary optical system and the resultant digital image in at least two opposing directions, for instance, in the left and right and/or fore and aft directions. The primary image data and the secondary image data may be distinct and/or may include portions that overlap with one another. Further, the primary image data and the secondary image data may be collected at the same or different resolutions. The collected primary image data and secondary image data are utilized to generate a single output image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile