The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2011

Filed:

Apr. 13, 2009
Applicant:

Takashi Murakami, Hachioji, JP;

Inventor:

Takashi Murakami, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29D 11/00 (2006.01); B29C 39/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A cellulose ester film exhibiting: a free volume radius of 0.25 to 0.31 nm and a half-width of 0.04 to 0.1 nm, the free volume radius and the half-width being determined by positron annihilation lifetime spectroscopy; and Ro of 0 to nm and Rt of −30 to +20 nm, Ro and Rt being defined by the following equations: Equation (a): Ro=(nx−ny)×d; Equation (b): Rt=((nx+ny)/2−nz)×d (Ro: in-plane retardation, Rt: retardation in the thickness direction of the film, nx: in-plane refractive index in slow axis direction, ny: in-plane refractive index in fast axis direction, nz: refractive index in the thickness direction of the film (refractive indexes being measured at wavelength of 590 nm), d: thickness of the film (nm)).


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