The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
Aug. 26, 2009
Adrian Popescu, Tampa, FL (US);
Lilia M. Woods, Tampa, FL (US);
Igor V. Bondarev, Fuquay Varina, NC (US);
Adrian Popescu, Tampa, FL (US);
Lilia M. Woods, Tampa, FL (US);
Igor V. Bondarev, Fuquay Varina, NC (US);
University of South Florida, Tampa, FL (US);
North Carolina Central University, Durham, NC (US);
Abstract
The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.