The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8060343 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 15, 2011

Filed:

Jul. 24, 2008
Applicant:

Tomio Sato, Kawasaki, JP;

Inventor:

Tomio Sato, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a semiconductor device for outputting only the necessary information from non-periodic noise information to the outside. An analysis object information extracting section specifies analysis object information used to analyze noise associated with a malfunction from the non-periodic noise information having a large amount of information and extracts only the specified analysis object information from the noise information. A communication section outputs the extracted analysis object information to the outside. Thus, the amount of the information can be reduced and the noise information can be outputted by an inexpensive communication section such as a serial communication device.


Find Patent Forward Citations

Quick Actions:

Sato, Tomio. (2011). Semiconductor device and noise measuring method (U.S. Patent No. 8060343). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8060343

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…