The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Nov. 30, 2005
Applicants:

Yasuo Namioka, Tokyo, JP;

Akiko Kase, Yokohama, JP;

Shinji Harasawa, Yokohama, JP;

Inventors:

Yasuo Namioka, Tokyo, JP;

Akiko Kase, Yokohama, JP;

Shinji Harasawa, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A display-device inspection apparatus includes a pointing device for following a position where an identification for identifying an attention area on an inspection image is displayed on the inspection image simultaneously, an attention area information extracting part for converting the identification into outline coordinate data to extract both positional information and shape information related to the attention area m a screen, an attention area information storing part for classifying and storing the positional information and the shape information on a basis of a predetermined standard of classification, and an analysis result outputting part for outputting inspection result information constructed by analyzing contents stored in the attention area information storing part.


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