The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Aug. 01, 2006
Applicants:

Edward A. Calvin, Austin, TX (US);

Wayne D. Roth, Leander, TX (US);

Inventors:

Edward A. Calvin, Austin, TX (US);

Wayne D. Roth, Leander, TX (US);

Assignee:

Luminex Corporation, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, data structures, and systems for classifying particles are provided. In particular, the methods and systems are configured to acquire a first set of data corresponding to measurable parameters of a microparticle and identify a location of a look-up table to which the first set of data corresponds, wherein the look-up table is framed by values associated with at least one of the measurable parameters. Furthermore, the methods and systems are configured to determine whether the first set of data fits one or more predefined algorithms respectively indicative of a different microparticle classification associated with the identified location of the look-up table. The methods and systems are further configured to classifying the microparticle within at least one predefined categorization based upon the determination of whether the first set of data fits the one or more predefined algorithms.


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