The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
May. 07, 2007
Marcus Pfister, Bubenreuth, DE;
Bernhard Sandkamp, Erlangen, DE;
Marcus Pfister, Bubenreuth, DE;
Bernhard Sandkamp, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
The invention relates to a method for producing a three-dimensional image dataset of a target volume by using an examination facility having at least two image recording facilities, each featuring a radiation source and a radiation detector, which can be rotated about an axis of rotation which is arranged perpendicular to the connecting line between the radiation source and the radiation detector, comprising: adjusting the recording areas of the image recording facilities such that the recording areas arranged offset in the z-direction supplement each other to form a recording area, which is enlarged in the z-direction; simultaneously recording two-dimensional images in different orientations by means of the image recording facilities rotating about their axis of rotation; reconstructing a three-dimensional sub-image dataset in each instance from the images of the individual image recording facilities; combining the sub-image datasets to form the three-dimensional image dataset.