The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Apr. 28, 2008
Applicants:

Ching-chun Huang, Taichung, TW;

Yao-jen Chang, Taipei, TW;

Ruei-cheng Wu, Kaohsiung, TW;

Cheng-peng Kuan, Hsinchu, TW;

Inventors:

Ching-Chun Huang, Taichung, TW;

Yao-Jen Chang, Taipei, TW;

Ruei-Cheng Wu, Kaohsiung, TW;

Cheng-Peng Kuan, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a system and method of image-based space detection. The system includes an image selection module, a 3-layer detection mechanism and an optimization module. At least one image processing area that may affect space-status judgment is selected from plural image processing areas. The 3-layer detection mechanism having an observation layer, a labeling layer, and a semantic layer observes the information about the selected image processing area, associates with a local classification model, and adjacent local constraint model and a global semantics model to completely describe the probability distribution of the links among the three layers, and provide global label constraint information. The optimization module analyzes the probability distribution and global label constraint information, and generates an image-based optimized space detection result.


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