The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Jun. 20, 2006
Applicants:

Kiyoshi Yanagisawa, Tokyo, JP;

Noriaki Matsuno, Tokyo, JP;

Inventors:

Kiyoshi Yanagisawa, Tokyo, JP;

Noriaki Matsuno, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 25/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test signal is generated and supplied to a signal processing circuit for making frequency conversion. A signal outputted from the signal processing circuit is detected to generate a detected signal including a detected positive signal corresponding to the positive signal of the test signal and a detected negative signal corresponding to the negative signal. And the level of the detected positive signal and the level of the detected negative signal are compared to output the comparison result indicating which level is higher. Further, an offset correction signal for making a level difference between the detected positive signal and the detected negative signal within a preset permissible range is generated, based on the comparison result, and offset correction of the test signal or modulated signal supplied from the outside is made in accordance with the offset correction signal.


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