The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
May. 02, 2008
Applicants:
Nikolai Ptitsyn, Moscow, RU;
Ole Eichhorn, Westlake Village, CA (US);
Inventors:
Nikolai Ptitsyn, Moscow, RU;
Ole Eichhorn, Westlake Village, CA (US);
Assignee:
Aperio Technologies, Inc., Vista, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Apparatus for and method of rapid three dimensional scanning and digitizing of an entire microscope sample, or a substantially large portion of a microscope sample, using a tilted sensor synchronized with a positioning stage. The system also provides a method for interpolating tilted image layers into a orthogonal tree dimensional array or into its two dimensional projection as well as a method for composing the volume strips obtained from successive scans of the sample into a single continuous digital image or volume.