The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
Feb. 10, 2005
Enis Ersue, Darmstadt, DE;
Stephan Wienand, Zwingenberg, DE;
Enis Ersue, Darmstadt, DE;
Stephan Wienand, Zwingenberg, DE;
Isra Vision System AG, Darmstadt, DE;
Abstract
The invention relates to a method for planning an inspection path () for at least one optical picture-taking device (), particularly a camera, for inspecting a three-dimensional object (). The picture-taking device () and the object () are movable relative to each other by means of a displacement device (). To ensure that the method for planning inspection paths and for determining areas to be inspected is easy to use and reliably covers all areas to be inspected, it is provided that, based on the design data (), particularly CAD data and/or data determined by a sensor, relating to the object () and/or an area () to be inspected on the object, and based on the optical imaging characteristics of the picture-taking device (), stored in electronic form, and using an arithmetic logic unit (), the inspection path () for the optical picture-taking device () is automatically determined by specifying a specific geometric relationship between the picture-taking device () and the surface to be inspected.