The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Feb. 23, 2011
Applicants:

Jae-gyun Shim, Suwon-si, KR;

Yun-sung NA, Cheunan-si, KR;

In-gu Jeon, Suwon-si, KR;

Tae-hung Ku, Suwon-si, KR;

Inventors:

Jae-Gyun Shim, Suwon-si, KR;

Yun-Sung Na, Cheunan-si, KR;

In-Gu Jeon, Suwon-si, KR;

Tae-Hung Ku, Suwon-si, KR;

Assignee:

TechWing Co., Ltd, Hwaseung-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in a horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.


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