The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
Dec. 05, 2006
Takahiro Harada, Kizugawa, JP;
Sadao Takeuchi, Nagaokakyo, JP;
Kiyoshi Ogawa, Kizugawa, JP;
Mitsutoshi Setou, Hamamatsu, JP;
Takahiro Harada, Kizugawa, JP;
Sadao Takeuchi, Nagaokakyo, JP;
Kiyoshi Ogawa, Kizugawa, JP;
Mitsutoshi Setou, Hamamatsu, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A sample platewith a sampleplaced thereon is initially set on a stage, and a visual image of the sample is taken with a CCD camera. This image is stored in an image data memory. Then, an operator removes the sample plate, sprays a matrix for a MALDI process onto the sampleand replaces the plate onto the stage. After that, when a predetermined operation is made, a clear image of the sample taken before the application of the matrix is shown on a display unit. On this image, the operator specifies a point or area for the analysis. The samplemay have been displaced due to the removal and replacement of the plate. Accordingly, an image analyzercalculates the direction and magnitude of the displacement, for example, by recognizing the position of the markings provided on the sample plate. A displacement correctorcomputes coordinate values in which the displacement is corrected. Thus, even if a displacement occurs, the mass analysis can be accurately performed on the point or area of the actual sample as specified on the clear visual image taken before the application of the matrix.