The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
Oct. 18, 2007
Minoru Seki, Tokyo, JP;
Junya Takagi, Yokkaichi, JP;
Kazuki Yamamoto, Kyoto, JP;
Yoshinori Akagi, Osaka, JP;
Minoru Seki, Tokyo, JP;
Junya Takagi, Yokkaichi, JP;
Kazuki Yamamoto, Kyoto, JP;
Yoshinori Akagi, Osaka, JP;
Sekisui Chemical Co., Ltd., Osaka, JP;
Abstract
This invention provides a measuring apparatus for microanalysis, which can be simply manufactured and can realize a number of analyses and measurements in a small analyte amount and particularly can analyze and measure a number of analytes having different concentrations and different analytes in a simultaneous and easy manner, and a measurement method of microanalysis using the apparatus. The measuring apparatus for microanalysis is characterized by comprising detection parts of m lines and n rows in communication with a micropassage for a waste solution, chambers of m lines and n rows in communication with the respective detection parts through a mixing flow passage, n first micropassages in communication with the respective line chambers through a passive valve, m second micropassages in communication with respective row chambers through a passive valve, and third micropassages in communication with the respective chambers for supplying gas and/or a washing solution.