The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2011

Filed:

Jul. 14, 2010
Applicants:

Akihiro Tomida, Kawasaki, JP;

Akihiro Kakinuma, Hadano, JP;

Daigoro Kanematsu, Yokohama, JP;

Naoko Baba, Kawasaki, JP;

Mitsutoshi Nagamura, Tokyo, JP;

Asako Watanabe, Kawasaki, JP;

Reiji Hashimoto, Yokohama, JP;

Yoshinori Nakajima, Yokohama, JP;

Inventors:

Akihiro Tomida, Kawasaki, JP;

Akihiro Kakinuma, Hadano, JP;

Daigoro Kanematsu, Yokohama, JP;

Naoko Baba, Kawasaki, JP;

Mitsutoshi Nagamura, Tokyo, JP;

Asako Watanabe, Kawasaki, JP;

Reiji Hashimoto, Yokohama, JP;

Yoshinori Nakajima, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

Multiple alignment patterns, each composed of first and second alignment pattern elements printed by forward and backward movements of a print head, respectively, are formed while the relative printing positions of the two elements are shifted. From optical characteristics data thereof, whether the data is influenced by a disturbance is determined. When the data is determined to be less influenced by the disturbance and therefore to be reliable, an adjusting value for aligning positions in printing in reciprocal movements is calculated by use of: data with the smallest relative printing position misalignment between the first and second alignment pattern elements; and data of optical characteristics close to the data. When the data is largely influence by the disturbance, a range of shifting of relative position is widened than that of the data less influenced by the disturbance so that more data pieces are used to obtain the adjusting value.


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