The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2011

Filed:

Oct. 29, 2008
Applicants:

Hien Phu Dang, Nanuet, NY (US);

Vijaveshwar Das Khanna, Millwood, NY (US);

Arun Sharma, New Rochelle, NY (US);

Sri M. Sri-jayantha, Ossining, NY (US);

Inventors:

Hien Phu Dang, Nanuet, NY (US);

Vijaveshwar Das Khanna, Millwood, NY (US);

Arun Sharma, New Rochelle, NY (US);

Sri M. Sri-Jayantha, Ossining, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for characterizing thermomechanical properties of an organic substrate includes the steps of: receiving an image of the substrate, the image including a geometric description of the circuit layers of the substrate; selecting a given one of the circuit layers for processing; converting the image to a 2-D FEM image of the given circuit layer; repeating the steps of selecting a given one of the circuit layers and converting the image to a 2-D FEM image of the selected layer until all of the layers have been processed; combining all of the 2-D FEM images corresponding to the layers to form a 3-D FEM image representing at least a portion of the substrate; determining a coefficient of thermal expansion (CTE), modulus and/or Poisson's ratio of the 3-D FEM image; and constructing a 3-D representation of the substrate as a function of the CTE, modulus and/or Poisson's ratio of the 3-D FEM image.


Find Patent Forward Citations

Dang, Hien. (2011). Characterizing thermomechanical properties of an organic substrate using three-dimensional finite element analysis (U.S. Patent No. 8056027). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8056027

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…