The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2011

Filed:

Aug. 29, 2007
Applicants:

Carol Delgaudio, Williston, VT (US);

Scott D. Hicks, Underhill Center, VT (US);

James A. Martin, Jr., Endicott, NY (US);

Diane C. Rauch, Williston, VT (US);

Inventors:

Carol Delgaudio, Williston, VT (US);

Scott D. Hicks, Underhill Center, VT (US);

James A. Martin, Jr., Endicott, NY (US);

Diane C. Rauch, Williston, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system is provided to demographically represent and implement one or more projects associated with an entity such as a corporation in a database so that the views into the database reflect a defined hierarchy of the demographics of the project or entity. The views may be created to reflect various aspects such as technological components, physical attributes of the entity, processes, or other attributes. The processes reflected by the views may also provide action based data elements for supporting the activities necessary to accomplish the processes over time. The project and associate views may also be organized by language or geographic requirements. In use, the invention may provide for management and control for large scale projects such as a migration from one organizational state to another.


Find Patent Forward Citations

Loading…