The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Mar. 03, 2008
Hoi Y. Chan, New Canaan, CT (US);
Thomas Y. Kwok, Township of Washington, NJ (US);
Hoi Y. Chan, New Canaan, CT (US);
Thomas Y. Kwok, Township of Washington, NJ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for autonomic problem determination. Events and problems associated with the events are received from a computing resource and are expressed as entries in an event-problem matrix. Expert knowledge is expressed as entries in one or more multi-level structure dictionaries. The system and method enables dynamic interaction between the events in the matrix and the current dictionaries with its entries being updated continuously to maximize correlation among the events and problems. The index of each term in the dictionary is used to calculate the weight of each event in the matrix wherein events having frequent association with a specific problem will be given a higher weight in the matrix. Using singular value decomposition (SVD), the weighted events enable an accelerated and accurate convergence to a set of specific associated problems. Feedback, responsive to the output of the problem determination, is provided to trigger the recalculation of the index of each associated term in the dictionaries, resulting in gradual evolution of the dictionaries to accumulate expert knowledge.