The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Oct. 23, 2007
Applicants:
Romer E. Rosales, Downingtown, PA (US);
Glenn Fung, Madison, WI (US);
Mark Schmidt, Athabasca, CA;
Sriram Krishnan, Exton, PA (US);
R. Bharat Rao, Berwyn, PA (US);
Inventors:
Romer E. Rosales, Downingtown, PA (US);
Glenn Fung, Madison, WI (US);
Mark Schmidt, Athabasca, CA;
Sriram Krishnan, Exton, PA (US);
R. Bharat Rao, Berwyn, PA (US);
Assignee:
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for multiple-label data analysis includes: obtaining labeled data points from more than one labeler; building a classifier that maximizes a measure relating the data points, labels on the data points and a predicted output label; and assigning an output label to an input data point by using the classifier.