The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Dec. 17, 2008
Applicants:
Jeff S. Brown, Fort Collins, CO (US);
Marek Marasch, Longmont, CO (US);
John Gatt, Fort Collins, CO (US);
Inventors:
Jeff S. Brown, Fort Collins, CO (US);
Marek Marasch, Longmont, CO (US);
John Gatt, Fort Collins, CO (US);
Assignee:
LSI Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of generating an IRF pattern for testing an IC and a test pattern generator are disclosed. In one embodiment, the method includes: (1) identifying a path of the integrated circuit for inline resistive fault pattern generation, (2) determining if the path is a minimal slack path of the IC and (3) generating, when the path is the minimal slack path, a restricted inline resistive fault pattern for the path using only a capture polarity having a minimal inherent margin.