The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2011

Filed:

Sep. 14, 2009
Applicants:

Urs Loher, Widen, CH;

Kurt Jensen, Wollerau, CH;

Volker Ziebart, Wiesendangen, CH;

Inventors:

Urs Loher, Widen, CH;

Kurt Jensen, Wollerau, CH;

Volker Ziebart, Wiesendangen, CH;

Assignee:

Mettler-Toledo AG, Greifensee, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An interior space of the at least one housing of a force-measuring device is filled with a gas composition that is distinguishable in at least one parameter from the ambient atmosphere. A sensor that is arranged in the interior space, or on the housing, measures this distinguishable parameter. A processing unit of the force-measuring device compares signals obtained from the sensor to monitor and determine the condition of the force-measuring device.


Find Patent Forward Citations

Loher, Urs. (2011). Method of monitoring and/or determining the condition of a force-measuring device, and force-measuring device (U.S. Patent No. 8055456). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8055456

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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