The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Jan. 07, 2008
Richard Owczarzy, Coralville, IA (US);
Bernardo Moreira, Iowa City, IA (US);
Yong You, Coralville, IA (US);
Mark Aaron Behlke, Coralville, IA (US);
Joseph Alan Walder, Chicago, IL (US);
Richard Owczarzy, Coralville, IA (US);
Bernardo Moreira, Iowa City, IA (US);
Yong You, Coralville, IA (US);
Mark Aaron Behlke, Coralville, IA (US);
Joseph Alan Walder, Chicago, IL (US);
Integrated DNA Technologies, Inc., Coralville, IA (US);
Abstract
The invention relates to methods and systems for predicting or estimating the melting temperature of duplex nucleic acids, in the presence of divalent cations, particularly duplexes of oligonucleotides which may be used as, for example, but not limited to primers or probes in PCR and/or hybridization assays. The methods and algorithms use novel formulas, having terms and coefficients that are functions of the particular nucleotide sequence, to estimate the effect of divalent cation salt conditions on the melting temperature.