The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Sep. 30, 2008
Jan Pingel, New Berlin, WI (US);
Micheal John Pantaleano, Willoughby, OH (US);
Bruce Gordon Fuller, Edmonton, CA;
Robert Joseph Mcgreevy, Oswego, IL (US);
Ian Edward Tooke, Innisfil, CA;
Kevin John Albert, Wauwatosa, WI (US);
John Joseph Baier, Mentor, OH (US);
Jan Pingel, New Berlin, WI (US);
Micheal John Pantaleano, Willoughby, OH (US);
Bruce Gordon Fuller, Edmonton, CA;
Robert Joseph McGreevy, Oswego, IL (US);
Ian Edward Tooke, Innisfil, CA;
Kevin John Albert, Wauwatosa, WI (US);
John Joseph Baier, Mentor, OH (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
A guidance system of an industrial process captures process parameter data that is correlated with a human-machine interface (HMI) in order to learn how an experienced operator selects visualizations of key performance indicators (KPI) in order to take a corrective action to address an abnormal or non-optimal performance condition. Such solution learning can be invoked to recognize onset of another similar occurrence and responding by suggesting visualizations utilized by the experienced operator to diagnose the problem. Analytics can further determine which visualizations provided useful information relative to the problem. In addition, the corrective action can be suggested or automatically implemented.