The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Apr. 06, 2007
Rie Nagato, Kamakura, JP;
Yoshihiro Ishikawa, Yokosuka, JP;
Rie Nagato, Kamakura, JP;
Yoshihiro Ishikawa, Yokosuka, JP;
NTT DoCoMo, Inc., Tokyo, JP;
Abstract
A measuring apparatus for measuring service quality in an area in a communication system, in which a plurality of base stations use one frequency band for transmitting downlink signals, includes: a receiver configured to receive constant power signals that are the downlink signals transmitted by the base stations through constant power channels in which transmission powers are constant; a reception power measuring unit configured to measure reception powers of the constant power signals transmitted by the respective base stations; a reception power selector configured to select a reception power which is a base for measurement of the quality in the area, out of the reception powers measured by the reception power measuring unit; and an area quality measuring unit configured to measure the quality in the area on the basis of the reception power selected by the reception power selector, and a total of the reception powers not selected by the reception power selector.