The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Jul. 27, 2009
Tomochika Murakami, Kanagawa, JP;
Tomochika Murakami, Kanagawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A primary test printing process of a plurality of copy-forgery-inhibited pattern images generated by changing one or both of print densities of the latent-image and background-image parts in a first pattern on the basis of a predetermined parameter is performed. The user selects one copy-forgery-inhibited pattern image which has the latent-image and background-image parts with approximate print densities from the plurality of copy-forgery-inhibited pattern images generated by the primary test printing process. A secondary test printing process of a plurality of copy-forgery-inhibited pattern images generated by changing one or both of print densities of the latent-image and background-image parts in a second pattern on the basis of the parameter used to determine the print densities of the latent-image and background-image parts of the selected copy-forgery-inhibited pattern image is performed. The user selects one copy-forgery-inhibited pattern image which has the latent-image and background-image parts with approximate print densities from the plurality of copy-forgery-inhibited pattern images generated by the secondary test printing process, and the parameter of the selected copy-forgery-inhibited pattern image is determined as a copy-forgery-inhibited pattern density parameter.