The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Aug. 14, 2007
Padmavathi Sundaram, Palo Alto, CA (US);
Sandy A. Napel, Menlo Park, CA (US);
Christopher F. Beaulieu, Los Altos, CA (US);
Afra J. Zomorodlan, Hanover, NH (US);
Padmavathi Sundaram, Palo Alto, CA (US);
Sandy A. Napel, Menlo Park, CA (US);
Christopher F. Beaulieu, Los Altos, CA (US);
Afra J. Zomorodlan, Hanover, NH (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
Improved surface feature recognition in CT images is provided by extracting a triangulated mesh representation of the surface of interest. Shape operators are computed at each vertex of the mesh from finite differences of vertex normals. The shape operators at each vertex are smoothed according to an iterative weighted averaging procedure. Principal curvatures at each vertex are computed from the smoothed shape operators. Vertices are marked as maxima and/or minima according to the signs of the principal curvatures. Vertices marked as having the same feature type are clustered together by adjacency on the mesh to provide candidate patches. Feature scores are computed for each candidate patch and the scores are provided as output to a user or for further processing.