The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2011

Filed:

Feb. 21, 2008
Applicants:

Xiaoye Wu, Rexford, NY (US);

David Allen Langan, Clifton Park, NY (US);

James Walter Leblanc, Niskayuna, NY (US);

Inventors:

Xiaoye Wu, Rexford, NY (US);

David Allen Langan, Clifton Park, NY (US);

James Walter LeBlanc, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In dual energy CT, through basis material decomposition (BMD), a pair of density images can be reconstructed. The noises in this image pair are negatively correlated due to the BMD process. A technique is presented for obtaining the monochromatic images at desired energy levels with reduced correlation noise. The technique includes obtaining a plurality of optimum attenuation coefficients for an energy level, selecting a desired energy level, obtaining a plurality of desired attenuation coefficients for the desired energy level, computing a scaling factor for a corresponding noise component based on the optimum attenuation coefficients and the desired attenuation coefficients, and generating a monochromatic image based upon the scaling factor.


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