The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Jul. 30, 2009
Clarence Lavere Gordon, Iii, Renton, WA (US);
Richard H. Bossi, Renton, WA (US);
John L. Adamski, Kenmore, WA (US);
Clarence Lavere Gordon, III, Renton, WA (US);
Richard H. Bossi, Renton, WA (US);
John L. Adamski, Kenmore, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method and apparatus for measuring a structure. An x-ray system and the structure are positioned relative to each other. The x-ray system comprises a gas source configured to provide a gas, a laser system configured to emit a laser beam, a steering system, and a detector. The steering system is configured to direct a first portion of the laser beam into the gas such that an electron beam is generated by the laser beam interacting with the gas and is configured to direct a second portion of the laser beam into the electron beam such that a collimated x-ray beam is formed. The detector is configured to detect the collimated x-ray beam. The collimated x-ray beam is emitted with the structure positioned relative to the x-ray system.