The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2011

Filed:

Oct. 20, 2006
Applicants:

Fritz Strähle, Heubach, DE;

Christoph Hauger, Aalen, DE;

Inventors:

Fritz Strähle, Heubach, DE;

Christoph Hauger, Aalen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/22 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a microscopy system for representing an object that can be placed on an object plane () of the microscopy system, the latter comprising a representation system () containing several optical elements for providing at least one optical representation path (). According to one embodiment of the invention, the optical elements comprise a plurality of optical lenses (-), through which the optical representation path(s) (-) pass(es) in sequence and which represent the object plane () in an intermediate image (P). The optical lenses (-) are configured in such a way that the representation of the object plane () in the intermediate image (P) is reduced a maximum 0.9 times, preferably a maximum 0.8 times, preferably a maximum 0.6 times, with 0.5 times being the preferred maximum reduction.


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