The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Oct. 15, 2008
Hiroshi Sasaki, Tokyo, JP;
Yasunari Matsukawa, Saitama, JP;
Hiroshi Sasaki, Tokyo, JP;
Yasunari Matsukawa, Saitama, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A scanning laser microscope includes a laser light source; an acousto-optic deflector having a crystal, being arranged in an optical path of a laser beam emitted from the laser light source and capable of changing a traveling direction of the laser beam when frequencies of acoustic waves applied to the crystal are changed; a frequency control unit configured to simultaneously apply acoustic waves having a plurality of frequencies to the crystal of the acousto-optic deflector; an objective lens configured to converge the laser beam emitted from the laser light source to form a beam spot on a specimen; and an optical scanning device configured to two-dimensionally scan the scanning spot by deflecting the laser beam in two directions perpendicular to each other. The acousto-optic deflector, the optical scanning device, and a pupil of the objective lens are arranged at positions optically conjugate with each other.