The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2011

Filed:

May. 15, 2008
Applicants:

Peter W. Lorraine, Niskayuna, NY (US);

Thomas E. Drake, Jr., Fort Worth, TX (US);

John B. Deaton, Jr., Niskayuna, NY (US);

Marc Dubois, Keller, TX (US);

Robert Filkins, Niskayuna, NY (US);

Inventors:

Peter W. Lorraine, Niskayuna, NY (US);

Thomas E. Drake, Jr., Fort Worth, TX (US);

John B. Deaton, Jr., Niskayuna, NY (US);

Marc Dubois, Keller, TX (US);

Robert Filkins, Niskayuna, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of spectroscopic analysis of a material using a laser ultrasound system. The method includes measuring amplitude displacement of a target surface that has been excited with a generation laser. The amplitude displacements relate to the target's optical absorption properties. Amplitude displacements are generated over a range of laser wavelengths to obtain an optical absorption signature useful to identify the target material characteristics.


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