The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Feb. 24, 2009
Koki Nakabayashi, Ashigarakami-gun, JP;
Tadashi Masuda, Ashigarakami-gun, JP;
Koki Nakabayashi, Ashigarakami-gun, JP;
Tadashi Masuda, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Fujinon Corporation, Saitama-Shi, JP;
Abstract
An optical tomographic image production apparatus includes an optical probe, in which a light-transmitting area that transmits measurement light and a light-blocking area that blocks the measurement light are formed. The light-blocking area is provided at a start position and an end position of the light-transmitting area. A tomographic image processing means detects an interference signal or tomographic information when the light-blocking area is irradiated with the measurement light. Further, the tomographic image processing means detects, based on the detected interference signal or tomographic information, interference signals or tomographic information obtained when the light-transmitting area is irradiated with the measurement light to produce a tomographic image in the light-transmitting area.