The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2011

Filed:

May. 23, 2006
Applicants:

Dale C. Flanders, Lexington, MA (US);

Yu Nathan LI, Lexington, MA (US);

Mark E. Kuznetsov, Lexington, MA (US);

Walid A. Atia, Lexington, MA (US);

Inventors:

Dale C. Flanders, Lexington, MA (US);

Yu Nathan Li, Lexington, MA (US);

Mark E. Kuznetsov, Lexington, MA (US);

Walid A. Atia, Lexington, MA (US);

Assignee:

Axsun Technologies, Inc., Billerica, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A spectroscopy wavelength and amplitude referencing system comprises an optical bench receiving a tunable optical signal from a tunable signal source, a wavelength reference detector on the bench for determining a wavelength of the tunable optical signal, an amplitude reference detector on the bench for determining an amplitude of the tunable optical signal and an output optical signal fiber for transmitting the tunable optical signal to a sample. Also, spectroscopy system controller determines a spectral response of the sample to the tunable optical signal by determining an instantaneous wavelength of the tunable optical signal by reference to the wavelength reference detector.


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