The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Oct. 18, 2007
Donald P. Bruyere, Tucson, AZ (US);
Ivan S. Ashcraft, Marana, AZ (US);
John B. Treece, Tucson, AZ (US);
Donald P. Bruyere, Tucson, AZ (US);
Ivan S. Ashcraft, Marana, AZ (US);
John B. Treece, Tucson, AZ (US);
Raytheon Company, Waltham, MA (US);
Abstract
A detection system and method. The inventive system includes an arrangement for receiving a frame of image data; an arrangement for performing a rate of change of variance calculation with respect to at least one pixel in said frame of image data; and an arrangement for comparing said calculated rate of change of variance with a predetermined threshold to provide output data. In the illustrative embodiment, the frame of image data includes a range/Doppler matrix of N down range samples and M cross range samples. In this embodiment, the arrangement for performing a rate of change of variance calculation includes an arrangement for calculating a rate of change of variance over an N×M window within the range/Doppler matrix. The arrangement for performing a rate of change of variance calculation includes an arrangement for identifying a change in a standard deviation of a small, localized sampling of cells. In accordance with the invention, the arrangement for performing a rate of change of variance calculation outputs a rate of change of variance pixel map.