The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8051697 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 08, 2011

Filed:

Oct. 16, 2008
Applicants:

David J. Nagel, Falls Church, VA (US);

R. Andrew Mcgill, Lorton, VA (US);

Patrick M. Mills, Arlington, VA (US);

Rekha Pai, Alexandria, VA (US);

Inventors:

David J. Nagel, Falls Church, VA (US);

R. Andrew McGill, Lorton, VA (US);

Patrick M. Mills, Arlington, VA (US);

Rekha Pai, Alexandria, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to chemical and bioanalytical sensors and sensor systems, particularly to systems incorporating a calibration device for sensors where the calibration device is comprised of an array of micromachined MEMS structures and materials for trapping and retaining calibrant or interferant materials until they are needed and released quantitatively using structure operatively associated with the array.


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