The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Dec. 31, 2007
Clive D. Bittlestone, Allen, TX (US);
Kenneth M. Butler, Richardson, TX (US);
Mark E. Mason, Allen, TX (US);
Stephanie Watts Butler, Richardson, TX (US);
Clive D. Bittlestone, Allen, TX (US);
Kenneth M. Butler, Richardson, TX (US);
Mark E. Mason, Allen, TX (US);
Stephanie Watts Butler, Richardson, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Systems and methods are provided for refining a design cycle for an integrated circuit. An integrated circuit design is generated. A plurality of non-critical paths within the integrated circuit design are identified. A set of at least one of the plurality of non-critical paths is modified to produce a modified design in which the sensitivity of each of the set of non-critical paths to at least one parameter is enhanced. Each parameter is either a design parameter or a process parameter. An integrated circuit is fabricated according to the modified design. The fabricated integrated circuit is evaluated to measure a set of timing data representing each of the plurality of non-critical paths. The value of the parameter is determined from the measured set of timing data.