The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2011

Filed:

Oct. 07, 2008
Applicants:

Marlin Wayne Frederick, Austin, TX (US);

David Paul Clark, Georgetown, TX (US);

Inventors:

Marlin Wayne Frederick, Austin, TX (US);

David Paul Clark, Georgetown, TX (US);

Assignee:

ARM Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of design of a standard cell and a standard cell is disclosed. The method design comprising the steps of: identifying a non-uniformity in a boundary condition of said standard cell that would affect a characteristic of a neighbouring standard cell; introducing a further non-uniformity into said cell to mitigate the effect of said identified non-uniform boundary condition on said characteristic of said neighbouring standard cell.


Find Patent Forward Citations

Frederick, Marlin. (2011). Compensating for non-uniform boundary conditions in standard cells (U.S. Patent No. 8051390). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8051390

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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