The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Sep. 24, 2007
Todd O. Dampier, Menlo Park, CA (US);
Todd O. Dampier, Menlo Park, CA (US);
Merced Systems, Inc., Redwood Shores, CA (US);
Abstract
A method includes processing a performance query to a dimensional data model by processing dimension coordinates that exist within the dimensional data model, wherein the dimension coordinates have a first particular grain ('finer grain') that is finer than a second particular grain ('coarser grain'), the method to determine an evaluative score for a particular finer grain value based on performance facts for dimension coordinates associated with the particular finer grain value. Performance parameters are determined relative to a particular coarser grain value, against which to measure the performance facts associated with the finer grain value, including processing the temporal relationships of finer grain values to coarser grain values for the dimension coordinates. The evaluative score is determined for the particular finer grain value based on performance facts of dimension coordinates having the particular finer grain value, in view of the determined performance parameters.