The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Oct. 09, 2007
Donald James Erdman, Raleigh, NC (US);
Jacques Rioux, Cary, NC (US);
Laura Elizabeth Jackson, Cary, NC (US);
Donald James Erdman, Raleigh, NC (US);
Jacques Rioux, Cary, NC (US);
Laura Elizabeth Jackson, Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A method is provided for analyzing operational risk associated with one or more organizations, comprising receiving operational loss data from a plurality of organizations at a third-party risk management entity that is a separate entity from the plurality of organizations. The operational loss data includes confidential information regarding one or more of the plurality of organizations. The data received from the plurality of organizations, including the confidential information, is pooled. The pooled data is used to generate an operational risk model for one of the plurality of organizations, and this operational risk model is transmitted to the organization. A system for modeling operational risk for a plurality of organizations is provided, comprising a first data store configured to collect data regarding operational losses from the plurality of organizations, whose data includes confidential information regarding one or more of the organizations. The system includes software instructions configured to pool the operational loss data collected from the plurality of organizations and software instructions configured to generate operational risk models for the organizations using the pooled data, wherein the confidential information is not removed from the pooled data. The system also includes a second data store configured to store the generated models.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile