The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2011

Filed:

Oct. 30, 2007
Applicants:

Seung-hyun Jang, Daejeon, KR;

Chul-soo Lee, Daejeon, KR;

Eui Suk Jung, Daejeon, KR;

Byoung Whi Kim, Daejeon, KR;

Inventors:

Seung-Hyun Jang, Daejeon, KR;

Chul-Soo Lee, Daejeon, KR;

Eui Suk Jung, Daejeon, KR;

Byoung Whi Kim, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a fault localization apparatus based on an optical communication network and a method thereof. In the fault localization apparatus according to the present invention, a downstream light source is used as a monitoring optical signal instead of using an additional monitoring light source and a subcarrier multiplexing (SCM) monitoring pulse signal of a certain frequency band having no interference with a frequency band of a downstream data signal is used and thus a fault position may be detected at low cost.


Find Patent Forward Citations

Jang, Seung-Hyun. (2011). Fault localization apparatus for optical line using subcarrier multiplexing (scm) monitoring signal and method thereof (U.S. Patent No. 8050554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8050554

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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