The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2011

Filed:

Jul. 20, 2007
Applicants:

Douglas C. Eberle, San Antonio, TX (US);

Craig M. Wall, San Antonio, TX (US);

Martin B. Treuhaft, San Antonio, TX (US);

Inventors:

Douglas C. Eberle, San Antonio, TX (US);

Craig M. Wall, San Antonio, TX (US);

Martin B. Treuhaft, San Antonio, TX (US);

Assignee:

Southwest Research Institute, San Antonio, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for the differential wear mapping of the surface of an object are described. The process involves establishing a radioactive wearing surface on the object through surface layer activation (SLA) and/or radioactive ion implantation (RII) and imaging the wearing surface with conformal photographic or x-ray film to produce a first autoradiograph providing a baseline profile of the wearing surface. After subjecting the object to wear during testing the wearing surface is again imaged with conformal photographic or x-ray film to produce a second autoradiograph providing a worn profile. The first and second autoradiographs of the wearing surface are digitized and compared to produce a differential wear map of the surface of the object.


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