The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Jul. 02, 2008
Yao Zhao, Shenzhen, CN;
Hai-sheng LI, Shenzhen, CN;
Hua-dong Cheng, Shenzhen, CN;
Wen-chuan Lian, Taipei Hsien, TW;
Han-che Wang, Taipei Hsien, TW;
Kuan-hong Hsieh, Taipei Hsien, TW;
Yao Zhao, Shenzhen, CN;
Hai-Sheng Li, Shenzhen, CN;
Hua-Dong Cheng, Shenzhen, CN;
Wen-Chuan Lian, Taipei Hsien, TW;
Han-Che Wang, Taipei Hsien, TW;
Kuan-Hong Hsieh, Taipei Hsien, TW;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A audio test method for decreasing noise influence, which includes the following steps: obtaining analog signals; converting the analog signals into digital signals; intercepting digital signals of a first predetermined length and executing a first Fast Fourier Transform (FFT), then obtaining an first Fourier spectrum; recording the amplitudes of frequency values of the first Fourier spectrum; intercepting digital signals of a second predetermined length and executing the second FFT, then obtaining an second Fourier spectrum; recording the amplitudes of the frequency values belonging to odd points of the second frequency spectrum, which are the amplitudes of the noise composition; subtracting the amplitudes of the noise composition from the amplitudes of frequency values of the first Fourier spectrum and obtaining a frequency domain signals without noise composition; executing inverse Fast Fourier Transform (iFFT) for the frequency domain signals and obtaining time domain signals, testing each parameter of the time domain signals.