The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
May. 22, 2008
Applicants:
Miki Ogawa, Machida, JP;
Norihiko Utsunomiya, Machida, JP;
Inventors:
Miki Ogawa, Machida, JP;
Norihiko Utsunomiya, Machida, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract
A detecting element for detecting a target substance in a sample includes a substrate having a pore, in which a thickness direction of the substrate corresponds to a depth direction of the pore, and plurality of metal structures disposed in the pore. The plurality of metal structures have a ring shape.
Ogawa, Miki. (2011). Detecting element, detecting device, and method of producing the detecting element (U.S. Patent No. 8049896). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8049896
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile