The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2011

Filed:

Nov. 27, 2006
Applicants:

Michael L. Myrick, Irmo, SC (US);

Robert P. Freese, Pittsboro, NC (US);

John C. Blackburn, Charleston, SC (US);

Ryan J. Priore, Columbia, SC (US);

Inventors:

Michael L. Myrick, Irmo, SC (US);

Robert P. Freese, Pittsboro, NC (US);

John C. Blackburn, Charleston, SC (US);

Ryan J. Priore, Columbia, SC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of arranging and utilizing a multivariate optical computing and analysis system includes transmitting light from a light source; reflecting the light from the sample; directing a portion of the light reflected from the sample with a beamsplitter; and arranging an optical filter mechanism in a normal incidence orientation to receive the light reflected from the sample, the optical filter mechanism configured to filter and measure data carried by the light reflected from the sample.


Find Patent Forward Citations

Myrick, Michael. (2011). Optical analysis system and methods for operating multivariate optical elements in a normal incidence orientation (U.S. Patent No. 8049881). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8049881

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…