The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Aug. 22, 2008
Leon Robert Zoeller, Iii, Hammondsport, NY (US);
Leon Robert Zoeller, III, Hammondsport, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
Systems () and methods are disclosed for detecting defects (DEF-DEF) in a ceramic filter body () having a honeycomb structure () that defined multiple channels (). Plugs () are used to seal select channel ends (). The methods include using a first light source unit () and a first detector unit () operably arranged at respective first and second ends () of the honeycomb structure so as to be capable of being in optical communication. Light beams (LB) are transmitted from the first light source unit to the first detector unit through multiple channels. Defects in a given plug allow a detectable portion (LBD) of the corresponding light beam to be detected. Multiple detector elements () are used to detect the detectable light beam portion to provide location and intensity variation information, which helps deduce the precise location and nature of the defect. Light source units (') at opposite ends () and detector units (′) at opposite ends () form a 'double-ended' system that allows for the simultaneous measurement of defect at both ceramic filter body ends. Systems and methods for measuring defects (DEF, DEF) for unplugged ceramic filter bodies are also disclosed.