The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2011
Filed:
Mar. 18, 2009
Christoph Hauger, Aalen, DE;
Markus Seesselberg, Aalen, DE;
Keith O'hara, Livermore, CA (US);
Yue Qiu, Pleasanton, CA (US);
Xing Wei, Dublin, CA (US);
Jochen M. Horn, San Francisco, CA (US);
Peter Reimer, Ellwangen, DE;
Christoph Hauger, Aalen, DE;
Markus Seesselberg, Aalen, DE;
Keith O'Hara, Livermore, CA (US);
Yue Qiu, Pleasanton, CA (US);
Xing Wei, Dublin, CA (US);
Jochen M. Horn, San Francisco, CA (US);
Peter Reimer, Ellwangen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A surgical microscopy system is provided wherein an optical coherence tomography facility is integrated into a microscopy system. A beam of measuring light formed by collimating optics of an OCT system is deflected by a beam scanner, traverses imaging optics, and is reflected by a reflector such that the beam of measuring light traverses an objective lens of microscopy optics and is directed to an object region of the microscopy optics. A position of the beam of measuring light being incident on the reflector is substantially independent on a direction into which the beam of measuring light is deflected by the beam scanner. When traveling through the beam scanner, the beam of measuring light is comprised of a bundle of substantially parallel light rays.